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Used by many organizations as a 'springboard' into the
Quality Improvement Program, Attribute Control Charting can identify those
processes affecting your operations. Whether the 'defect' is a missed
sale or torn sail, an unanswered phone or phone that wont ring,
SPC-PC IV provides a tool to improve your bottom line.
SPC-PC IV offers the following charts for
attribute data:
- NP, C, P
,
and U charts
based on data entered as counts or percentages.
- Display as fraction, percentage, parts per million,
or user-defined labels
- Control limits based on constant, varying or average
subgroup size.
- Perform short run analysis.
- Pareto Diagram
To
determine which of several classifications have the highest count or
cost associated with them, a Pareto Diagram prioritizes competing or
conflicting problems so that resources are allocated to the most significant
areas.
- Run Charts For
plotting individual data values without statistical control limits,
Run Charts automatically employ Western Electric Run Test 2, 3, and
4 as an option to recognize trends.
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